Stress migration and the mechanical properties of copper
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx5/9994/32106/01493058.pdf?arnumber=1493058
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5. Modeling the copper microstructure and elastic anisotropy and studying its impact on reliability in nanoscale interconnects;Mechanics of Advanced Materials and Modern Processes;2017-03-28
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