RIS-Aided Smart Manufacturing: Information Transmission and Machine Health Monitoring-Reference-Cited by-同舟云学术

RIS-Aided Smart Manufacturing: Information Transmission and Machine Health Monitoring

Author:

Hoang Tiep M.¹^ORCID,Dinh-Van Son²^ORCID,Barn Balbir³,Trestian Ramona³^ORCID,Nguyen Huan X.³^ORCID

Affiliation:

1. Department of Electrical Engineering, The University of Colorado Denver, Denver, CO, USA

2. School of Engineering, The University of Warwick, Coventry, U.K.

3. London Digital Twin Research Centre, Middlesex University, London, U.K.

Funder

U.K.–India Education and Research Initiative

U.K. Department for Business, Energy and Industrial Strategy and Department for Education and delivered by the British Council

Van Lang University

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Computer Networks and Communications,Computer Science Applications,Hardware and Architecture,Information Systems,Signal Processing

Link

Reference25 articles.

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