WideScan: Exploiting Out-of-Band Distortion for Device Classification Using Deep Learning
Author:
Funder
National Science Foundation
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9322055/9321973/09348138.pdf?arnumber=9348138
Cited by 13 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. A Comprehensive Survey on Deep Learning-Based LoRa Radio Frequency Fingerprinting Identification;Sensors;2024-07-08
2. No Blind Spots: On the Resiliency of Device Fingerprints to Hardware Warm-Up Through Sequential Transfer Learning;Proceedings of the 17th ACM Conference on Security and Privacy in Wireless and Mobile Networks;2024-05-27
3. Sensitivity Analysis of RFML Applications;IEEE Access;2024
4. 3D Convolution-Based Radio Frequency Fingerprinting for Satellite Authentication;GLOBECOM 2023 - 2023 IEEE Global Communications Conference;2023-12-04
5. A Needle in a Haystack: Distinguishable Deep Neural Network Features for Domain-Agnostic Device Fingerprinting;2023 IEEE Conference on Communications and Network Security (CNS);2023-10-02
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