Author:
Shmarlouski Anatoli,Schock-Kusch Daniel,Shulhevich Yury,Buschmann Volker,Rohlicke Tino,Herdt Deborah,Radle Matthias,Hesser Jurgen,Stsepankou Dzmitry
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Cited by
8 articles.
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