Data-Driven Sensor Fault Diagnosis Under Closed-Loop Control With Slow Feature Analysis
Author:
Affiliation:
1. College of Electrical Engineering and Automation, Shandong University of Science and Technology, Qingdao, China
Funder
National Natural Science Foundation of China
Research Fund for the Taishan Scholar Project of Shandong Province of China
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Instrumentation
Link
http://xplorestaging.ieee.org/ielx7/7361/9984967/09953056.pdf?arnumber=9953056
Reference40 articles.
1. Reconstruction based fault prognosis for continuous processes
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