Total dose and proton testing of a commercial HgCdTe array-Reference-Cited by-同舟云学术

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Total dose and proton testing of a commercial HgCdTe array

Published:1994-12 Issue:6 Volume:41 Page:1966-1973
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Hopkinson G.R.,Baddiley C.J.,Guy D.R.P.,Parsons J.E.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

http://xplorestaging.ieee.org/ielx1/23/7975/00340531.pdf?arnumber=340531

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Dark Current Evolution in Irradiated MWIR HgCdTe Photodiodes;Journal of Electronic Materials;2023-09-26

2. Design, Annealing, and Electric Field Effects on Proton and Gamma Irradiated MWIR HgCdTe Focal Plane Arrays;IEEE Transactions on Nuclear Science;2023-04

3. Proton effects in charge-coupled devices;IEEE Transactions on Nuclear Science;1996-04

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