OP-AMP sizing by inference of element values using machine learning
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/8259049/8265629/08266553.pdf?arnumber=8266553
Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Enhancing Transistor Sizing in Analog IC Design using a Circuit-Focused Semi-Supervised Learning;2023 IEEE 4th International Multidisciplinary Conference on Engineering Technology (IMCET);2023-12-12
2. FuNToM: Functional Modeling of RF Circuits Using a Neural Network Assisted Two-Port Analysis Method;2023 IEEE/ACM International Conference on Computer Aided Design (ICCAD);2023-10-28
3. A genetic‐algorithm‐based synthesis of microwave integrated distributed amplifiers;International Journal of Numerical Modelling: Electronic Networks, Devices and Fields;2023-07-11
4. AnGeL: Fully-Automated Analog Circuit Generator Using a Neural Network Assisted Semi-Supervised Learning Approach;IEEE Transactions on Circuits and Systems I: Regular Papers;2023
5. A Review of Machine Learning Techniques in Analog Integrated Circuit Design Automation;Electronics;2022-01-31
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