Author:
Krasniewski A.,Pilarski S.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software
Cited by
47 articles.
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1. X-Tolerant Logic BIST for Automotive Designs using Observation Scan Technology;2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID);2024-01-06
2. Time and Area Optimized Testing of Automotive ICs;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2021-01
3. A new test set compression scheme for circular scan;EURASIP Journal on Embedded Systems;2018-07-03
4. Trimodal Scan-Based Test Paradigm;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2017-03
5. Representative Scan Architecture;Journal of Circuits, Systems and Computers;2016-02-25