Funder
Ministry of Science and Technology of the Republic of China
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality,Electronic, Optical and Magnetic Materials
Cited by
33 articles.
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1. Revisiting row hammer: A deep dive into understanding and resolving the issue;Microelectronics Reliability;2024-09
2. Unveiling RowPress in Sub-20 nm DRAM Through Comparative Analysis With Row Hammer: From Leakage Mechanisms to Key Features;IEEE Transactions on Electron Devices;2024-08
3. SoK: Rowhammer on Commodity Operating Systems;Proceedings of the 19th ACM Asia Conference on Computer and Communications Security;2024-07
4. An Experimental Characterization of Combined RowHammer and RowPress Read Disturbance in Modern DRAM Chips;2024 54th Annual IEEE/IFIP International Conference on Dependable Systems and Networks - Supplemental Volume (DSN-S);2024-06-24
5. TAROT: A CXL SmartNIC-Based Defense Against Multi-bit Errors by Row-Hammer Attacks;Proceedings of the 29th ACM International Conference on Architectural Support for Programming Languages and Operating Systems, Volume 3;2024-04-27