Characterization of Backside-Illuminated CMOS APS Prototypes for the Extreme Ultraviolet Imager On-Board Solar Orbiter-Reference-Cited by-同舟云学术

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Characterization of Backside-Illuminated CMOS APS Prototypes for the Extreme Ultraviolet Imager On-Board Solar Orbiter

Published:2013-05 Issue:5 Volume:60 Page:1701-1708
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

BenMoussa Ali,Giordanengo Boris,Gissot Samuel,Meynants Guy,Wang Xinyang,Wolfs Bram,Bogaerts Jan,Schuhle Udo,Berger Guy,Gottwald Alexander,Laubis Christian,Kroth Udo,Scholze Frank

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx7/16/6504760/06502680.pdf?arnumber=6502680

Cited by 12 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Analysis of Light Intensity and Charge Holding Time Dependence of Pinned Photodiode Full Well Capacity;Sensors;2023-10-31

2. Single event transient effect of frontside and backside illumination image sensors under proton irradiation;Acta Physica Sinica;2022

3. Characterization facility for the MAJIS/JUICE VIS-NIR FM and SM detectors;Space Telescopes and Instrumentation 2020: Optical, Infrared, and Millimeter Wave;2020-12-13

4. MAJIS/JUICE VIS-NIR FM and SM detectors characterization;Space Telescopes and Instrumentation 2020: Optical, Infrared, and Millimeter Wave;2020-12-13

5. Displacement damage effects induced by fast neutron in backside-illuminated CMOS image sensors;Journal of Nuclear Science and Technology;2020-04-19

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