A Unified Physical-Based Model of Series Resistance of Polycrystalline Silicon Thin-Film Transistors With Explicit Analytical Solutions
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Published:2013-09
Issue:9
Volume:60
Page:2827-2833
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ISSN:0018-9383
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Container-title:IEEE Transactions on Electron Devices
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language:
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Short-container-title:IEEE Trans. Electron Devices
Author:
Wang Mingxiang,He Ronghua,Zhang Dongli
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials