Contactless measurements of the internal capacitance of a Corbino ring in the quantum Hall regime
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Instrumentation
Link
http://xplorestaging.ieee.org/ielx5/19/16684/00769588.pdf?arnumber=769588
Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. The Quantum Hall Effect as an Electrical Resistance Standard;The Quantum Hall Effect;2005
2. Effects of metallic gates on ac measurements of the quantum hall resistance;IEEE Transactions on Instrumentation and Measurement;2003-04
3. The quantum Hall effect as an electrical resistance standard;Reports on Progress in Physics;2001-11-08
4. Magnetization and dissipation measurements in the quantum Hall regime using an integrated micromechanical magnetometer;Journal of Applied Physics;2000-05
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