Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Cited by
4 articles.
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1. Aries: A Semiformal Technique for Fine-Grained Bug Localization in Hardware Designs;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2022-12
2. Model Checking Leveraged Error Localization for Complex RTL Designs;2022 IEEE 40th International Conference on Computer Design (ICCD);2022-10
3. Counting bugs in behavioural models using counterexample analysis;Proceedings of the IEEE/ACM 10th International Conference on Formal Methods in Software Engineering;2022-05-18
4. Debugging of BPMN Processes Using Coloring Techniques;Formal Aspects of Component Software;2022