A Self-Checking Scheme to Mitigate Single Event Upset Effects in SRAM-Based FPAAs-Reference-Cited by-同舟云学术

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A Self-Checking Scheme to Mitigate Single Event Upset Effects in SRAM-Based FPAAs

Published:2009-08 Issue:4 Volume:56 Page:1950-1957
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Balen Tiago R.,Leite Franco,Kastensmidt Fernanda Lima,Lubaszewski Marcelo

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

http://xplorestaging.ieee.org/ielx5/23/5204511/05204593.pdf?arnumber=5204593

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. Fault tolerant architectures by partial reconfiguration;SPIE Proceedings;2013-05-28

3. New Design of Mobile Robot Path Planning with Randomly Moving Obstacles;Tikrit Journal of Engineering Sciences;2013-03-31

4. Checkers for Online Self-Testing of Analog Circuits;Advanced Circuits for Emerging Technologies;2012-05-07

5. TID in a Switched-Capacitor FPAA: Degradation and Partial Inactivity Windows Due to Compensating Effects in MOS Transistors;IEEE Transactions on Nuclear Science;2011-12

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