Supports for Testing Memory Error Handling Code of In-memory Key Value Stores
Author:
Affiliation:
1. TUAT,Tokyo,Japan
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10533187/10533272/10533273.pdf?arnumber=10533273
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1. DRAM errors in the wild
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3. Revisiting Memory Errors in Large-Scale Production Data Centers: Analysis and Modeling of New Trends from the Field
4. Mellow Writes: Extending Lifetime in Resistive Memories through Selective Slow Write Backs
5. Balancing Performance and Lifetime of MLC PCM by Using a Region Retention Monitor
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