Author:
Kato Fumiki,Sato Shinji,Harda Shinsuke,Hozoji Hiroshi,Sakai Aki,Wantanabe Kinuyo,Yamaguchi Hiroshi,Sato Hiroshi
Cited by
1 articles.
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1. Effect of Gate Pad Layout on Thermal Impedance of SiC-MOSFET;2022 International Conference on Electronics Packaging (ICEP);2022-05-11