Author:
Luijckx G.,Bijleveld J.H.M.,Rookhuizen H.B.,Bruinsma P.J.T.,Kaan A.P.,Kroes F.B.,Kuijer L.H.,Maas R.,Noomen J.G.,Post J.C.,Spelt J.B.,de Vries C.
Cited by
2 articles.
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1. Emittance increase due to transient beam loading;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;1999-05
2. Polarized electrons in AmPS;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;1999-05