ADC histogram test by triangular small-waves-Reference-Cited by-同舟云学术

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ADC histogram test by triangular small-waves

Published: Issue: Volume: Page:
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Container-title:IMTC 2001. Proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference. Rediscovering Measurement in the Age of Informatics (Cat. No.01CH 37188)
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Author:

Alegria F.,Arpaia P.,da Cruz Serra A.M.,Daponte P.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/7381/20096/00929490.pdf?arnumber=929490

Cited by 9 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. A Structured Methodology for Measurement Development;IEEE Transactions on Instrumentation and Measurement;2015-09

3. Low-Power High-Resolution Analog to Digital Converters;ANALOG CIRC SIG PROC;2011

4. Overdrive in the Ramp Histogram Test of ADCs;IEEE Transactions on Instrumentation and Measurement;2005-12

5. A time efficient method for determination of static non-linearities of high-speed high-resolution ADCs;Measurement;2005-09

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