Customized Fixture Adapter for Accurate CM Choke Impedance Measurement up to 100 MHz-Reference-Cited by-同舟云学术

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Customized Fixture Adapter for Accurate CM Choke Impedance Measurement up to 100 MHz

Published:2022-12-09 Issue: Volume: Page:
ISSN:
Container-title:2022 4th International Conference on Smart Power & Internet Energy Systems (SPIES)
language:
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Author:

Jie Huamin¹,Gao Si-Ping²,Zhao Zhenyu¹,Fan Fei¹,Yang Zhenning¹,Dong Minghai³,Sasongko Firman⁴,Gupta Amit K⁴,Yak See Kye¹

Affiliation:

1. Nanyang Technological University,School of Electrical and Electronic Engineering,Singapore

2. National University of Singapore,Singapore

3. University of Electrical Science and Technology of China,School of Aeronautics and Astronautics,China

4. Rolls-Royce Singapore Pte Ltd,Singapore

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10081933/10081944/10082373.pdf?arnumber=10082373

Reference12 articles.

1. A Survey of Impedance Measurement Methods in Power Electronics

2. Characterization of Component Under DC Biasing Condition Using an Inductive Coupling Approach

3. Characterizing Microwave Connectors Over Temperature: Thermal-Stable Standards and Characterization Method

4. A Review of EMI Research in Modular Multilevel Converter for HVDC Applications

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A review of intentional electromagnetic interference in power electronics: Conducted and radiated susceptibility;IET Power Electronics;2024-03-13

2. Bypass Capacitor Design for Wideband Impedance Measurements of Inductive Coupling Approaches;2023 2nd International Conference on Sensing, Measurement, Communication and Internet of Things Technologies (SMC-IoT);2023-12-29

3. Investigation on Phase Sensitivity Unveiling of Finite-Element Analysis Modelled Single-Phase Common-Mode Chokes;IECON 2023- 49th Annual Conference of the IEEE Industrial Electronics Society;2023-10-16

4. High-Precision Broadband Impedance Measurements of Three-Phase Common-Mode Chokes Using Single-Port Circuit De-Embedding and Three-Port Network Calibration Methods;IEEE Transactions on Industrial Electronics;2023

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