Identifying Radiation-Induced Micro-SEFIs in SRAM FPGAs
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Published:2021-10
Issue:10
Volume:68
Page:2480-2487
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ISSN:0018-9499
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Container-title:IEEE Transactions on Nuclear Science
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language:
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Short-container-title:IEEE Trans. Nucl. Sci.
Author:
Perez-Celis AndresORCID,
Thurlow Corbin,
Wirthlin MichaelORCID
Funder
I/UCRC Program of the National Science Foundation
Los Alamos Neutron Science Center (LANSCE) in December, 2018
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics