Single-Event Effects Testing of the Renesas ISL70005SEH Dual Output Point-of-Load Regulator-Reference-Cited by-同舟云学术

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Single-Event Effects Testing of the Renesas ISL70005SEH Dual Output Point-of-Load Regulator

Published:2020-11 Issue: Volume: Page:
ISSN:
Container-title:2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)
language:
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Author:

van Vonno N. W.¹,Mansilla O.¹,Gill J. S.¹,Newman W. H.¹,Pearce L. G.¹,Thomson E. J.¹

Affiliation:

1. Renesas Electronics America,Palm Bay,Florida,32905

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9325819/9325820/09325859.pdf?arnumber=9325859

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Research on Single Event Transients in Linear Voltage Regulators in a 28 nm Bulk CMOS Technology;IEEE Transactions on Nuclear Science;2023

2. Fault Tolerant Synchronous Multi-Channel Buck Converter for Nuclear Inspection Instruments;2022 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS);2022-04-06

3. Total Dose Testing of the Renesas ISL70005SEH Hardened Dual Output Point of Load Regulator;2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS);2020-10

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