Author:
Weiss George H.,Dishon Menachem
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality
Cited by
41 articles.
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1. On the change points of mean residual life and failure rate functions for some generalized gamma type distributions;International Journal of Metrology and Quality Engineering;2014
2. Burn-in and the performance quality measures in continuous heterogeneous populations;Proceedings of the Institution of Mechanical Engineers, Part O: Journal of Risk and Reliability;2012-04-30
3. Shocks as Burn-In in Heterogeneous Populations;Communications in Statistics - Theory and Methods;2012-01-15
4. Burn-in and the performance quality measures in heterogeneous populations;European Journal of Operational Research;2011-04
5. On the odd Weibull distribution;Proceedings of the Institution of Mechanical Engineers, Part O: Journal of Risk and Reliability;2008-12-01