Automatic characterization of MEMS electronic filters-Reference-Cited by-同舟云学术

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Automatic characterization of MEMS electronic filters

Published:2022-10-12 Issue: Volume: Page:
ISSN:
Container-title:2022 IEEE 11th International Conference on Intelligent Systems (IS)
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Author:

Wasilewska Natalia¹,Nowicki Michal²,Szewczyk Roman³,Nowak Pawel²

Affiliation:

1. Laboratory of Metrology,Railway Research Institute,Warsaw,Poland

2. Warsaw University of Technology,Institute of Metrology and Biomedical Engineering,Warsaw,Poland

3. ŁUKASIEWICZ Research Network - Industrial Research Institute for Automation and Measurements PIAP,Warsaw,Poland

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10019601/10019606/10019667.pdf?arnumber=10019667

Reference11 articles.

1. G104-A2LA Guide for estimation of measurement uncertainty in testing;adams;American Association of Laboratory Accreditation Manual,2002

2. ILAC Policy for Measurement Uncertainty in Calibration;International Laboratory Accreditation Cooperation,2020

3. Evaluation of the Uncertainty of Measurement In Calibration,2013

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