Author:
Rizwan Muhammad,Nadeem Aamer,Sindhu Mudassar Azam
Cited by
2 articles.
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1. Study on the Use of Defect Metrics in the Software Development Process. Flaws and Vulnerabilities;2023 IEEE International Conference on Engineering Veracruz (ICEV);2023-10-23
2. A framework for improving the process of potential faults detection at the design coupling;2023 IEEE 3rd International Maghreb Meeting of the Conference on Sciences and Techniques of Automatic Control and Computer Engineering (MI-STA);2023-05-21