Predictable ESD Criteria with Proposed Comparison Diagram between TLP and HBM ESD for Various Device Technologies and Different Substrates
Author:
Affiliation:
1. QRT Inc.,Korea
2. Ewha Womans University,Korea
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10102927/10102928/10102935.pdf?arnumber=10102935
Reference6 articles.
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4. Overview of on-chip electrostatic discharge protection design with SCR-based devices in CMOS integrated circuits
5. Achieving Uniform nMOS Device Power Distribution for Submicron ESD Reliability;duvvury;Proc 1992 IEEE International Electron Device Meeting,0
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