Analog circuit equivalent faults in the D.C. domain-Reference-Cited by-同舟云学术

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Analog circuit equivalent faults in the D.C. domain

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Container-title:Proceedings of the Ninth Asian Test Symposium
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Author:

Worsman M.,Wong M.W.T.,Lee Y.S.

Publisher

IEEE Comput. Soc

Link

http://xplorestaging.ieee.org/ielx5/7181/19338/00893607.pdf?arnumber=893607

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Analog Defect Injection and Fault Simulation Techniques: A Systematic Literature Review;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2024-01

2. Fault Vulnerability Ranking of Transistors in Analog Integrated Circuits using AC Analysis;2020 IEEE International Test Conference India;2020-07

3. A new diagnosis approach for handling tolerance in analog and mixed-signal circuits by using fuzzy math;IEEE Transactions on Circuits and Systems I: Regular Papers;2005-10

4. Study of test approach for IP cores applicable to SOC designs;ASICON 2001. 2001 4th International Conference on ASIC Proceedings (Cat. No.01TH8549)

5. Enhancing the static D.C. fault diagnosis of a Resistance Temperature Detector sensor circuit using equivalent fault analysis;Proceedings First IEEE International Workshop on Electronic Design, Test and Applications '2002

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