A Compact First-Order Modulator for Analog High-Volume Testing of Complex System-on-Chips in a 14 nm Tri-Gate Digital CMOS Process-Reference-Cited by-同舟云学术

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A Compact First-Order Modulator for Analog High-Volume Testing of Complex System-on-Chips in a 14 nm Tri-Gate Digital CMOS Process

Published:2016-02 Issue:2 Volume:51 Page:378-390
ISSN:0018-9200
Container-title:IEEE Journal of Solid-State Circuits
language:
Short-container-title:IEEE J. Solid-State Circuits

Author:

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx7/4/7398196/7370772.pdf?arnumber=7370772

Cited by 10 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. Large Network of Wide- Range Analog Voltage Observers for Debug & Testability;2023 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS);2023-11-19

3. Compact Thermal Sensors for Dense CPU Thermal Monitoring and Regulation: A Review;IEEE Sensors Journal;2021-06-01

4. A 2 nW 0.25 V 140 dB-FOM Inverter-Based First Order ΔΣ Modulator;IEEE Transactions on Circuits and Systems II: Express Briefs;2020-09

5. A Miniaturized 0.003 mm2 PNP-Based Thermal Sensor for Dense CPU Thermal Monitoring;IEEE Transactions on Circuits and Systems I: Regular Papers;2020-09

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