Author:
Brand C.,Cairanti G.,Charpentier P.,Clara M.P.,Delikaris D.,Foeth H.,Heck B.W.,Hilke H.J.,Sulkowski K.,Aubert C.,Billoir P.,Boutonnet C.,Courty P.,Crozon M.,Delpierre P.,Diaczek A.,Mas J.,Saget G.,Tilquin A.,Turlot J.P.,Vergezac P.,Antilogus P.,Augustin J.E.,Gaillard M.,Gros M.H.,Hrisoho A.,Jean-Marie B.,Lepeltier V.,Noppe J.M.,Richard F.,Truong K.,Bolognese T.,Borgeaud P.,DeBeer M.,Jarry P.,Mur M.,Raoul J.C.,Ruhlmann V.,Sacquin Y.,Siegrist P.,Smadja G.,Turluer M.,Vilanova D.,Darbo G.,Vernocchi F.,Barring O.,Jarlskog G.,Kack S.,Lorstadt B.,Mjornmark U.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics
Cited by
10 articles.
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