A Study of BER and EVM Degradation in Digital Modulation Schemes Due to PLL Jitter and Communication-Link Noise-Reference-Cited by-同舟云学术

A Study of BER and EVM Degradation in Digital Modulation Schemes Due to PLL Jitter and Communication-Link Noise

Published:2022-08 Issue:8 Volume:69 Page:3402-3415
ISSN:1549-8328
Container-title:IEEE Transactions on Circuits and Systems I: Regular Papers
language:
Short-container-title:IEEE Trans. Circuits Syst. I

Author:

Oveisi Mohammad¹^ORCID,Heydari Payam²^ORCID

Affiliation:

1. Department of Electrical Engineering and Computer Science, Nanoscale Communication Integrated Circuits (NCIC) Laboratories, The University of California, Irvine (UCI), Irvine, CA, USA

2. Department of Electrical and Computer Engineering and Department of Biomedical Engineering, Nanoscale Communication Integrated Circuits (NCIC) Laboratories, Center for Pervasive Communication and Computing, The University of California, Irvine (UCI), Irvine, CA, USA

Funder

National Science Foundation

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Hardware and Architecture

Link

https://ieeexplore.ieee.org/ielam/8919/9841618/9774014-aam.pdf

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