RoIA: Region of Interest Attention Network for Surface Defect Detection-Reference-Cited by-同舟云学术

RoIA: Region of Interest Attention Network for Surface Defect Detection

Published:2023-05 Issue:2 Volume:36 Page:159-169
ISSN:0894-6507
Container-title:IEEE Transactions on Semiconductor Manufacturing
language:
Short-container-title:IEEE Trans. Semicond. Manufact.

Author:

Liu Taiheng¹^ORCID,Cao Guang-Zhong²,He Zhaoshui³,Xie Shengli³

Affiliation:

1. Guangdong Key Laboratory of Electromagnetic Control and Intelligent Robots, College of Mechatronics and Control Engineering, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen, China

2. Guangdong Key Laboratory of Electromagnetic Control and Intelligent Robots, College of Mechatronics and Control Engineering, Shenzhen University, Shenzhen, China

3. School of Automation and Guangdong-HongKong-Macao Joint Laboratory for Smart Discrete Manufacturing, Guangdong University of Technology, Guangzhou, China

Funder

National Key Research and Development Program of China

National Natural Science Foundation of China

Guangdong Province Foundation

Shenzhen Science and Technology Program

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Industrial and Manufacturing Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx7/66/10119187/10104585.pdf?arnumber=10104585

Reference39 articles.