Automated Visual Inspection of Defects in Transparent Display Layers Using Light-Field 3-D Imaging
Author:
Affiliation:
1. School of Computing, KAIST, Daejeon, South Korea
2. Large Display Inspection Machine Development Department, Samsung Display, Yongin, South Korea
Funder
Samsung Display
MSIT/IITP of Korea
NIRCH of Korea
Samsung Research Funding Center for developing partial 3-D imaging algorithms
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Industrial and Manufacturing Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://xplorestaging.ieee.org/ielx7/66/10209215/10138698.pdf?arnumber=10138698
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4. Focus model for metric depth estimation in standard plenoptic cameras
5. An effective defect inspection system for polarized film images using image segmentation and template matching techniques
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