A Large-scale Empirical Study on theVulnerability of Deployed IoT Devices

Author:

Zhao Binbin,Ji Shouling,Lee Wei-Han,Lin Changting,Weng Haiqin,Wu Jingzheng,Zhou Pan,Fang Liming,Beyah Raheem

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

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