Author:
Wang L.-C.,Mercer P.R.,Kao S.W.,Williams T.W.
Cited by
21 articles.
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1. Automatic Test Pattern Generation;Electronic Design Automation for IC System Design, Verification, and Testing;2016-04-14
2. Defect Coverage-Driven Window-Based Test Compression;2010 19th IEEE Asian Test Symposium;2010-12
3. Improved$n$-Detection Test Sequences Under Transparent Scan;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2006-11
4. On High-Quality, Low Energy Built-In Self Test Preparation at RT-Level;Journal of Electronic Testing;2004-08
5. Design and test of a certifiable ASIC for a safety-critical gas burner control system;Journal of Electronic Testing;2002