Parametric and catastrophic fault coverage of analog circuits in oscillation-test methodology-Reference-Cited by-同舟云学术

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Parametric and catastrophic fault coverage of analog circuits in oscillation-test methodology

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Container-title:Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125)
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Author:

Arabi K.,Kaminska B.

Publisher

IEEE Comput. Soc. Press

Link

http://xplorestaging.ieee.org/ielx3/4653/13046/00600246.pdf?arnumber=600246

Cited by 20 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Influence of PVT Variation and Threshold Selection on OBT and OBIST Fault Detection in RFCMOS Amplifiers;IEEE Open Journal of Circuits and Systems;2023

2. Digital Defect-Oriented Test Methodology for Flipped Voltage Follower Low Dropout (LDO) Voltage Regulators;2022 35th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design (SBCCI);2022-08-22

3. Application of oscillation-based self-testing systems for higher order active RC low-pass filters;2020 43rd International Conference on Telecommunications and Signal Processing (TSP);2020-07

4. Fault Vulnerability Ranking of Transistors in Analog Integrated Circuits using AC Analysis;2020 IEEE International Test Conference India;2020-07

5. Formal Techniques for Verification and Coverage Analysis of Analog Systems;Formal System Verification;2017-06-22

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