March LR: a test for realistic linked faults-Reference-Cited by-同舟云学术

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March LR: a test for realistic linked faults

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Container-title:Proceedings of 14th VLSI Test Symposium
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Author:

van de Goor A.J.,Gaydadjiev G.N.,Mikitjuk V.G.,Yarmolik V.N.

Publisher

IEEE Comput. Soc. Press

Link

http://xplorestaging.ieee.org/ielx3/3739/10937/00510868.pdf?arnumber=510868

Cited by 52 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Word-Oriented Memory Test and Coupling Fault Coverage: a RAW and RAW1 Case Study;2024 Panhellenic Conference on Electronics & Telecommunications (PACET);2024-03-28

2. Linked Coupling Faults Detection by Multirun March Tests;Applied Sciences;2024-03-15

3. A New Test Algorithm and Fault Simulator of Simplified Three-Cell Coupling Faults for Random Access Memories;IEEE Access;2024

4. A New Fail Address Memory Architecture for Cost-Effective ATE;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023

5. Fault-coverage Maximizing March Tests for Memory Testing;2022 IEEE International Test Conference (ITC);2022-09

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