A new in situ procedure for measuring the dielectric properties of low permittivity materials-Reference-Cited by-同舟云学术

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A new in situ procedure for measuring the dielectric properties of low permittivity materials

Published:1986-03 Issue:1 Volume:IM-35 Page:2-6
ISSN:0018-9456
Container-title:IEEE Transactions on Instrumentation and Measurement
language:
Short-container-title:IEEE Trans. Instrum. Meas.

Author:

Olson Steven C.,Iskander Magdy F.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation

Link

http://xplorestaging.ieee.org/ielx7/19/6324682/06499047.pdf?arnumber=6499047

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