Author:
Hakmi Abdul-Wahid,Holst Stefan,Wunderlich Hans-Joachim,Schlöffel Jürgen,Hapke Friedrich,Glowatz Andreas
Cited by
21 articles.
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1. A Hybrid Test Scheme for Automotive IC in Multisite Testing;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2022-12
2. Adjustable PRPG for Low Power Test Patterns;International Journal of Recent Technology and Engineering;2021-03-30
3. A Cascaded Multicasting Architecture for Test Data Compression;Journal of Electronic Testing;2021-03-19
4. Low Cost Hypercompression of Test Data;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2020-10
5. Deterministic Stellar BIST for Automotive ICs;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2020-08