Author:
Vijayakumar Priyamvada,Narayanan Pritish,Koren Israel,Krishna C. Mani,Moritz C. Andras
Cited by
2 articles.
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1. FastTrack: Toward Nanoscale Fault Masking With High Performance;IEEE Transactions on Nanotechnology;2012-07
2. Biased Voting for Improved Yield in Nanoscale Fabrics;2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems;2011-10