Noise and ionization rate measurements in silicon photodiodes
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Link
http://xplorestaging.ieee.org/ielx5/16/31627/01474470.pdf?arnumber=1474470
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3. All-Silicon Waveguide Avalanche Photodetectors With Ultrahigh Gain-Bandwidth Product and Low Breakdown Voltage;IEEE Journal of Selected Topics in Quantum Electronics;2014-11
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