Fabrication and characterization of low-loss TFMS on silicon substrate up to 220 GHz-Reference-Cited by-同舟云学术

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Fabrication and characterization of low-loss TFMS on silicon substrate up to 220 GHz

Published:2005-01 Issue:1 Volume:53 Page:301-305
ISSN:0018-9480
Container-title:IEEE Transactions on Microwave Theory and Techniques
language:
Short-container-title:IEEE Trans. Microwave Theory Techn.

Author:

Six G.,Prigent G.,Eric Rius ,Dambrine G.,Happy H.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Radiation

Link

http://xplorestaging.ieee.org/ielx5/22/30125/01381701.pdf?arnumber=1381701

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