Technique to Determine Intense Electron Beam Parameters and X-Ray Spectra From Dose-Rate Measurements at Different Angles
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Published:2020-10
Issue:10
Volume:48
Page:3637-3649
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ISSN:0093-3813
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Container-title:IEEE Transactions on Plasma Science
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language:
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Short-container-title:IEEE Trans. Plasma Sci.
Author:
Weber Bruce V.ORCID,
Hinshelwood David D.,
Swanekamp Stephen B.ORCID,
Rittersdorf Ian M.,
Renk Timothy J.
Funder
U.S. Defense Threat Reduction Agency
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Condensed Matter Physics,Nuclear and High Energy Physics