Author:
Blaes B.R.,Buehler M.G.,Lin Y.S.,Hicks K.A.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics
Cited by
5 articles.
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2. Evaluation of OKI SOI technology;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2007-09
3. CRRES microelectronic test chip orbital data. II;IEEE Transactions on Nuclear Science;1992-12
4. CRRES microelectronic test chip;IEEE Transactions on Nuclear Science;1991-12
5. Radiation dependence of inverter propagation delay from timing sampler measurements;IEEE Transactions on Nuclear Science;1989-12