Study of tantalum oxide thin film capacitors on metallized polymer sheets for advanced packaging applications
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
General Engineering
Link
http://xplorestaging.ieee.org/ielx4/96/12470/00575561.pdf?arnumber=575561
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2. Effect of Electrode Roughness on Electroforming inHfO2and Defect-Induced Moderation of Electric-Field Enhancement;Physical Review Applied;2015-12-29
3. Effect of Firing Rates on Electrode Morphology and Electrical Properties of Multilayer Ceramic Capacitors;Journal of the American Ceramic Society;2011-10
4. Electrode Defects in Multilayer Capacitors Part I: Modeling the Effect of Electrode Roughness and Porosity on Electric Field Enhancement and Leakage Current;Journal of the American Ceramic Society;2011-08-02
5. Dielectric Response of Tantalum Oxide Deposited on Polyethylene Terephthalate (PET) Film by Low-Temperature Pulsed-DC Sputtering for Wound Capacitors;IEEE Transactions on Components and Packaging Technologies;2009-12
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