Enabling testability of fault-tolerant circuits by means of I/sub DDQ/-checkable voters
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Published:2000-08
Issue:4
Volume:8
Page:415-419
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ISSN:1063-8210
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Container-title:IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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language:
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Short-container-title:IEEE Trans. VLSI Syst.
Author:
Bogliolo A.,Favalli M.,Damiani M.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software