Experimental Test Approach for SEFI Categorization in Microprocessors

Author:

Houssany S.1,Guibbaud N.1,Miller F.1,Cheviron T.1,Colladant T.2

Affiliation:

1. Nuclétudes,France

2. DGA,Paris,France

Publisher

IEEE

Reference14 articles.

1. EEMB: The Embedded Microprocessor Benchmark Consortium,0

2. MiBench: A free, commercially representative embedded benchmark suite;guthaus;Proc IEEE Int Workshop on Workload Characterization (WWC-4),2001

3. Single-Event Effects in Low-Cost, Low-Power Microprocessors

4. Evaluating the SEE sensitivity of a 45nm SOI Multi-core Processor due to 14 MeV Neutrons;ramos;IEEE Transactions on Nuclear Science Institute of Electrical and Electronics Engineers,2016

5. Single-Event Effects in Low-Cost, Low-Power Microprocessors

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