A Neural Network Approach for Single-Event Latchup Prediction Based on TCAD Simulations in CMOS Technology-Reference-Cited by-同舟云学术

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A Neural Network Approach for Single-Event Latchup Prediction Based on TCAD Simulations in CMOS Technology

Published:2021-09 Issue: Volume: Page:
ISSN:
Container-title:2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
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Author:

Truyen D.¹,Leduc E.¹,Montagner L.²,Briet M.¹,Collange A.²

Affiliation:

1. Microchip Technology,Nantes,France,44300

2. Microchip Technology,13106

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9954459/9954461/09954493.pdf?arnumber=9954493

Reference15 articles.

1. The effect of temperature on single-particle latchup

2. Single Event Latch-Up Hardening Using TCAD Simulations in 130 nm and 65 nm Embedded SRAM in Flash-Based FPGAs

3. Selection of Well Contact Densities for Latchup-Immune Minimal-Area ICs

4. Fundamentals of Ocean Renewable Energy;neill,0

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1. Quantitative Laser Testing for Predicting Heavy-Ion SEE Response – Part 1: Metrics for Assessing Response Agreement;IEEE Transactions on Nuclear Science;2023

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