Negative Bias Temperature Instability in Low-Temperature Polycrystalline Silicon Thin-Film Transistors-Reference-Cited by-同舟云学术

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Negative Bias Temperature Instability in Low-Temperature Polycrystalline Silicon Thin-Film Transistors

Published:2006-12 Issue:12 Volume:53 Page:2993-3000
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

Chen Chih-Yang,Lee Jam-Wem,Wang Shen-De,Shieh Ming-Shan,Lee Po-Hao,Chen Wei-Cheng,Lin Hsiao-Yi,Yeh Kuan-Lin,Lei Tan-Fu

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx5/16/4016323/04016327.pdf?arnumber=4016327

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