Spatial resolution limit for the investigation of high-T/sub c/ films by low temperature scanning electron microscopy-Reference-Cited by-同舟云学术

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Spatial resolution limit for the investigation of high-T/sub c/ films by low temperature scanning electron microscopy

Published:1989-03 Issue:2 Volume:25 Page:2250-2253
ISSN:0018-9464
Container-title:IEEE Transactions on Magnetics
language:
Short-container-title:IEEE Trans. Magn.

Author:

Gross R.,Hartmann M.,Hipler K.,Huebener R.P.,Kober F.,Koelle D.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx1/20/3041/00092756.pdf?arnumber=92756

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4. Nonlocal response of grain-boundary-type Josephson junctions to local perturbation;Physical Review B;1995-09-01

5. Resistance flicker noise and current percolation in c-oriented YBa2Cu3O7−x films in the vicinity of Tc;Physica C: Superconductivity;1995-05

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