Impact of Defect Instances for Successful Deep Learning-based Automatic Program Repair-Reference-Cited by-同舟云学术

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Impact of Defect Instances for Successful Deep Learning-based Automatic Program Repair

Published:2022-10 Issue: Volume: Page:
ISSN:
Container-title:2022 IEEE International Conference on Software Maintenance and Evolution (ICSME)
language:
Short-container-title:

Author:

Kim Misoo¹,Kim Youngkyoung²,Heo Jinseok²,Jeong Hohyeon²,Kim Sungoh³,Lee Eunseok⁴

Affiliation:

1. Sungkyunkwan University,Institute of Software Convergence,Suwon,Republic of Korea

2. Sungkyunkwan University,Department of Electrical and Computer Engineering,Suwon,Republic of Korea

3. Mobile eXperience, Samsung Electronics,SW Engineering Group,Suwon,Republic of Korea

4. Sungkyunkwan University,College of Computing and Informatics,Suwon,Republic of Korea

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9977440/9977441/09978242.pdf?arnumber=9978242

Reference21 articles.

1. Hoppity: Learning graph transformations to detect and fix bugs in programs;dinella;International Conference on Learning Representations (ICLR),2020

2. DEAR

3. Neural Transfer Learning for Repairing Security Vulnerabilities in C Code

4. Exploring the limits of transfer learning with a unified text-to-text transformer;raffel;J Mach Learn Res,2020

5. Spectrum-based multi-fault localization using Chaotic Genetic Algorithm

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