Rapid Measurement of Dielectric Constant and Loss Tangent
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Radiation
Link
http://xplorestaging.ieee.org/ielx6/4547924/24865/01125039.pdf?arnumber=1125039
Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
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5. An uncertainty analysis for the measurement of microwave conductivity and dielectric constant by the short-circuited line method;IEEE Transactions on Instrumentation and Measurement;1986-03
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